CHRISTINE CARAGIANIS BROADBRIDGE, Physics
Professor of Physics, Southern Connecticut State University
Visiting Research Fellow, Yale University
Education Director; Center for Research on Interface Structures and Phenomena (CRISP) – an NSF MRSEC at Yale/SCSU/BNL
PAPERS PUBLISHED IN PROCEEDINGS:
C. Caragianis, D. C. Paine, C. Roberts, and E. Crisman, "High Pressure Oxidation of Strained Si1-xGex Alloys", Chemical Perspectives of Microelectronic Materials II, (MRS, Pittsburgh, 1991), p. 361.
C. Caragianis, D. C. Paine, A. F. Schwartzman, and Y. Shigesato, "Oxidation of Si1-xGex Alloys at Elevated Pressure", in MRS Symposium Proceedings Vol. 251, (MRS, Pittsburgh, 1992), p. 65.
C. Caragianis, Y. Shigesato, and D. C. Paine, "High Pressure Oxidation for Low Temperature Passivation of Si1-xGex Alloys", in The Physics and Chemistry of Si-SiO2 and the Si-SiO2Interface 2, (Plenum Pub., N. Y., 1993), p. 71.
D. C. Paine, C. Caragianis, T. Y. Kim, Y. Shigesato, "Nanocrystalline Ge Synthesis by Reduction of Si1-xGexO2 formed by High Pressure Oxidation", MRS Symposium on Microcrystalline Semiconductors Materials Science and Devices, edited by Y. Aoyagi, (Materials Research Society, Boston, 1993), Vol. 283.
C. Caragianis-Broadbridge, B. L. Walden, J. Blaser, C. Ow Yang, and D. C. Paine, "Low Temperature - High Pressure Oxidation of 3C - SiC", Structure and Properties of Interfaces in Ceramics, (Materials Research Society, Boston, 1995), Vol. 357.
J. M. Blaser, C. Caragianis-Broadbridge, B. L. Walden and D. C. Paine, "A Study of the Effect of Oxide Structure on the Synthesis of Nanocrystalline Ge from Si1-xGex O2, Thermodynamics and Kinetics of Phase Transformations, (Materials Research Society, Boston, 1996), Vol. 398.
S. Srinivasan, R. B. LaComb,
F. Jain, J. Mott, and C. Caragianis-Broadbridge,
"Fabrication and Characterization of Resonant Tunneling Transistor
Lasers", Proceedings of the 1996
C. Caragianis-Broadbridge, J. A. Cooper and J. Blaser, "AFM Study Of Ge Nanocrystals Suspended in SiO2
Matrix", Proceedings of the 1996
C. Caragianis-Broadbridge, Renee N. Johnson, "The United Technologies/Trinity College Engineering Initiative (UTCEI): A Model For The Partnership Of the Future", Proceedings 1997 Joint NAMEPA/WEPAN National Conference.
C. Caragianis-Broadbridge, J. Blaser and D. Paine, "A Cross-sectional AFM/TEM study of Nanocrystalline Ge Precipitates in SiO2 formed from Metastable Ge1-xSixO2", Proceedings of the 1997 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, Spring 1997.
J. Miecznikowski, C. Newman, R. Churchwell, C. Caragianis-Broadbridge, and J. P. Han; "Impact of Deposition Method on the Microstructural Properties of Thin Film Silica Aerogels", Proceedings of the 1999 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 1999.
C. Caragianis-Broadbridge, D. Stoane,
"The United
C. Caragianis-Broadbridge, D. Stoane,
"The United Technologies/Trinity College Engineering Initiative: A
Proven Model for the Accretion and Retention of Women and Minorities in the
Fields of Engineering and Science", Proceedings of the 29th ASEE/IEEE
Frontiers in Education Conference,
J. Miecznikowski, C. Caragianis-Broadbridge, Wenjuan Zhu, Zhijiong Lu, and Jin-Ping Han, "Microstructure and Electronic Properties of Thin Film Silica Aerogels as a Function of Processing and Annealing Methods", Proceedings of the 2000 Connecticut Symposium on Microelectronics and Optoelectronics, United Technologies Research Center, East Hartford, CT; April 2000.
C. Caragianis-Broadbridge, J. R. Miecznikowski, W. Zhu, Z. Luo, J. Han and A. Hein Lehman, "Microstructure and Electronic Properties of Thin Film Nanoporous Silica as a Function of Processing and Annealing Methods", Materials, Technology, and Reliability for Advanced Interconnects and Low-k Dielectrics, (Materials Research Society, San Francisco, 2000), Vol. 398.
C. Caragianis-Broadbridge, Danae L. Stoane, "The United Technologies/Trinity College Engineering Initiative (UTCEI): A Proven Model for the Partnership of the Future", Proceedings of the ICECE 2000 International Conference on Engineering and Computer Education, Sao Paulo, Brazil, August, 2000.
C. Caragianis-Broadbridge, A. Hein Lehman, J. R. Miecznikowski and K. Klein, "Properties of Thin Film Nanoporous Silica as a Function of Processing and Annealing Methods", Microscopy and Microanalysis 2000, Proceedings of the Microscopy Society of America, Vol. 6, August 2000.
C. Caragianis-Broadbridge, J.-P. Han, T. P. Ma, A. H. Lehman, W. Zhu, Z. Luo, D. L. Pechkis, B. L. Laube; “Microstructure and Physical Characterization of Ferroelectric-gate Memory Capacitors with Various Buffer Layers”, Transport and Microstructural Phenomena in Oxide Electronics, (Materials Research Society, San Francisco, 2001), Vol. 666.
W. Zhu, T. Tamagawa, J. Kim, C. Caragianis-Broadbridge, X. W. Wang, and T.P. Ma, Characteristics of Ultra-Thin Hafnium Oxide Gate Dielectrics”, Presentation and abstract published in Proceedings of the 2001 Connecticut Symposium on Microelectronics and Optoelectronics, UCONN, April 3, 2001.
X.W. Wang, H.M. Bu, B.L. Laube, C.Caragianis-Broadbridge and T.P. Ma, “Improving 4H-SiC/SiO2 Interface Properties by Depositing Ultra-thin Si Nitride Layer Prior to Formation of SiO2 and Annealing”, presented at the International Conference on Silicon Carbide and Related Materials 2001 (ICSCRM2001); Tsukuba, Japan; October 2001.
X. W. Wang, H. M. Bu, C. Caragianis-Broadbridge and T.P. Ma, “Improving 4H-SiC/SiO2 Interface Using an Interfacial Si Nitride Layer”, Presentation and abstract published in Proceedings of the 2002 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 2002.
C. Caragianis-Broadbridge, D. L. Pechkis, J.-P. Han, A. H. Lehman, K.L. Klein, C. J. Xie, W. Tong, K. –H. Kim, and T.P. Ma, “Impact of Annealing Temperature on the Microstructure and Physical Properties of Ferroelectric-gate Memory Capacitors”, Presentation and abstract published in Proceedings of the 2002 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 2002.
D. L. Pechkis, C. Caragianis-Broadbridge, A. H. Lehman, K. L. Klein, J.–P. Han, and T.P. Ma, “Thin Film Thickness Determination of Ferroelectric SrBi2Ta2O9 with Cross-Sectional Atomic Force Microscopy”, Presentation and abstract published in Proceedings of the 2002 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 2002.
L. M. Toscano, C. Caragianis-Broadbridge, M. J. G. Lesley, “The Functionality of Thin Tin Deposits as Solderability Preservative for Printed Circuit Boards”, Presentation and abstract published in Proceedings of the 2002 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 2002.
C. Wynschenk, S. Sinha, C. Caragianis-Broadbridge, K. Klein, A. Lehman, “Studies on the Growth Conditions for Silicon Nanowires”, Presentation and abstract published in Proceedings of the 2002 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 2002.
D. L. Pechkis, C. Caragianis-Broadbridge, A. H. Lehman, K. L. Klein, J.–P. Han, and T.P. Ma, “Thin Film Thickness Determination of Ferroelectric SrBi2Ta2O9 with Cross-Sectional Atomic Force Microscopy”, Microscopy and Microanalysis 2002, Presentation and abstract published in Proceedings of the Microscopy Society of America, August 2002.
L. Toscano, C. Caragianis-Broadbridge, M.J.G. Lesley, “The Functionality of Thin Tin Deposits as a Solderability Preservative for Printed Circuit Boards”, Presentation and abstract published in Proceedings of the 2003 Connecticut Symposium on Microelectronics and Optoelectronics, University of Connecticut, April 2003.
J.
McGuinness, E. Anderson and C. Caragianis-Broadbridge,
K. H. Wee and A. H. Lehman, S. X. Luo, S. Calvin,
S.A. Morrison and K. Kurihara, “Transmission Electron
Microscopy Study of Polydispersed Nanoparticles”,
Presentation and abstract published in Proceedings of the 2004 Connecticut
Symposium on Microelectronics and Optoelectronics,
Y. X. Lui, C. Caragianis-Broadbridge, A. H. Lehman, J. McGuinness, T. P. Ma, “Preparation, Microstructure and Physical Characteristics of Pb5Ge3O11 Thin Films for Memory Applications”, Presentation and abstract published in Proceedings of the 2004 Connecticut Symposium on Microelectronics and Optoelectronics, University of Connecticut, April 7, 2004.
Y. X. Liu, C. Caragianis-Broadbridge, A.H. Lehman, J. McGuinness, and T.P.Ma; “Preparation, Microstructure and Physical Characteristics of Ferroelectric Pb5Ge3O11 Thin Films for Memory Application”, Ferroelectric Thin Films XII, (Materials Research Society, Boston, 2004), Vol. 784.
T. Sadowski, C. Caragianis-Broadbridge, J. DaPonte, “Digital Signal
Processing of Microscopy Images”, Presentation and abstract published in
Proceedings of the 2005 Connecticut Symposium on Microelectronics and
Optoelectronics,
J. Su, M. Gherasimova, G. Cui, J. Han, Y. He, A. Nurmiko, T. Onuma, F. Chichibu, C. Broadbridge and A. Lehman, “Epitaxially Aligned GaN Nanowires and Nanobridges by MOCVD”, Presentation and abstract published in Proceedings of the 2005 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 17, 2005.
T.E. Sadowski, C. Caragianis-Broadbridge, J.DaPonte: “Statistical Texture Analysis of Microscopy Images for the Purposes of Surface Characterization”, poster presentation at the Fall Meeting of the Materials Research Society, Dec. 2005.
J. McGuinness, D. Day, C. Caragianis-Broadbridge,
A. Lehman, G.Lesley,
R. Fitzsimmons, R. Koekkoek, C. Caragianis-Broadbridge, A. Lehman and K. Cummings, “An Exploration of Microscopy for Educational Applications in the High School Physics Classroom”, poster presentation at the Fall Meeting of the Materials Research Society, Dec. 2005.
J. Su, M. Gherasimova, G. Cui, J. Han, S. Lim, D. Ciuparu, L. Pfefferle, Y. He, A. V. Nurmikko, C. Broadbridge, A. Lehman, T. Onuma, M. Kuimoto, S. F. Chichibu, “Vapor-liquid-solid Growth of III-Nitride Nanowires and Heterostructures by Metal-Organic Chemical Vapor Deposition”, GaN, AlN, InN and Their Alloys, (Materials Research Society, Boston, 2005), Vol. 831.
T.E. Sadowski, C. C.
Broadbridge, J.DaPonte: “Statistical Texture Analysis of Microscopy
Images for the Purposes of Surface Characterization” in Combinatorial
Methods and Informatics in Materials Science, edited by Q. Wang, R.A. Potyrailo, M.Fasolka, T. Chikyow, U.S. Schubert, A. Korkin
(Mater. Res. Soc. Symp. Proc. Vol. 894,
R. Fitzsimmons, R. Koekkoek, C. Caragianis-Broadbridge,
A. Lehman and K. Cummings, "An Exploration of Microscopy for Educational
Applications in the High School Physics Classroom", in Forum on Materials
Science Education, edited by Trevor R. Finlayson, Fiona M. Goodchild, M. Grant Norton, Scott R. J. Oliver (Mater. Res.
Soc. Symp. Proc. 891,
T. Sadowski, C. C Broadbridge, J. DaPonte, “Statistical Texture Analysis of Microscopy Images for the Purposes of Surface Characterization”, Presentation and abstract published in Proceedings of the 2006 Connecticut Symposium on Microelectronics and Optoelectronics, University of Connecticut, April 5, 2006.
J. McGuinness, C. Caragianis-Broadbridge, A. Lehman, “The Impact of Specimen Preparation on Transmission Electron Microscopic Analysis of Nanoparticles”, Presentation and abstract published in Proceedings of the 2006 Connecticut Symposium on Microelectronics and Optoelectronics, University of Connecticut, April 5, 2006.
S. Walck, Z. Radi, A. Barna, J. Lehman, C.C. Broadbridge, C. Tirrell and M. Enjalran, invited presentation and abstract published in the proceedings of The International Conference on Metallurgical Coatings and Thin Films April 23-27, 2007 San Diego, CA
J. DaPonte, T. Sadowski, C. C. Broadbridge, D. Day, A.
Lehman, D. Krishna , L. Marinella, P. Munhutu and M. Sawicki, “Application of particle analysis to
transmission electron microscopy (TEM)” presented at the SPIE Symposium on Defense & Security
April 9-13, 2007 Orlando, Florida, paper
published in the Proceedings Volume: Visual Information Processing
XVI (vol:
6575).
J. DaPonte, T.
Sadowski, C. C. Broadbridge, D. Day, A. Lehman, D. Krishna , L. Marinella, P.
Munhutu and M. Sawicki , “Comparison of thresholding
techniques on nanoparticle images” presented at
the SPIE Symposium on Defense &
Security April 9-13, 2007 Orlando, Florida, paper published in the conference
proceedings Volume Visual Information Processing XVI (vol: 6575).
M. Sawicki, T. Sadowski, D. Day, A. Lehman, J. DaPonte and C. C. Broadbridge, “Image processing effects on nanoparticle measurements using TEM”, Presentation and abstract published in Proceedings of the 2007 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 21, 2007.
C. Tirrell, M. Enjalran, M. Sawicki, P. Carter, J. Lehman, S. Walck and C. C. Broadbridge, “Computational modeling of the electric field line distribution surrounding focus ion beam thinned TEM specimens”, Presentation and abstract published in Proceedings of the 2007 Connecticut Symposium on Microelectronics and Optoelectronics, Yale University, March 21, 2007.
T. Sadowski, C. C. Broadbridge, J. DaPonte, “Comparison of
common segmentation techniques applied to transmission electron microscopy
images”, in Electron Microscopy Across Hard and Soft Materials, edited
by T.J. Balk, A. Minor, A. Porter, J. Plitzko (Mater.
Res. Soc. Symp. Proc. 982E,
JOURNAL ARTICLES PUBLISHED:
D. C. Paine, C. Caragianis, A. F. Schwartzman, and Y. Shigesato, "Oxidation of Si1-xGex Alloys at Atmospheric and Elevated Pressure", J. Appl. Phys., 70(9), 1991, p. 5076.
D. C. Paine, C. Caragianis, Y. Shigesato, "Nanocrystalline Germanium Synthesis from Hydrothermally Oxidized Si1-xGex Alloys", Appl. Phys. Lett., 60(23), 8(1992).
D. C. Paine, C. Caragianis, T. Y. Kim, Y. Shigesato and T. Ishahara, "Visible Photoluminescence from Nanocrystalline Ge Formed By H2 Reduction of Si0.6Ge0.4 O2", Appl. Phys. Letts., 62( 22), 2842(1993).
Zvanut, M. E.; Carlos, N. E.; Paine, D. C.; Caragianis, C., "Atomic Structure of Ge-related Point Defects in Ge-incorporated Oxide Films", Appl. Phys. Letts., 63, 3049(1993).
C. Caragianis, Y. Shigesato, and D. C. Paine, "Low Temperature Passivation of Si1-xGex Alloys by Dry High Pressure Oxidation," Journal of Electronic Materials, 23, 9(1994).
D.C. Paine, T. Y. Kim, C. Caragianis, Y. Shigesato, "Nanocrystalline Ge Synthesis by the Chemical Reduction of Hydrothermally Grown Si0.6Ge0.4 O2", Journal of Electronic Materials, 23, 9(1994).
C. Caragianis-Broadbridge, J. Blaser and D.C. Paine; "A Cross-sectional AFM Study of Nanocrystalline Ge Precipitates in SiO2 Formed from Metastable Ge1-xSixO2", J. Appl. Phys., 82, 1626(1997).
D. Vernon, J. Rankin, C. Caragianis-Broadbridge, B. Laube; "A Novel Processing Route to Control Grain Growth in Submicron Alumina Compacts"; Journal of the American Ceramic Society, 82, 11(1999).
J. Han, X.Guo, C.Caragianis-Broadbridge Broadbridge,T.P. Ma, A. Ils, M Cantoni, J-M. Sallese, and P. Fazan, “Buffer Layer dependence of memory effects for SrBi2Ta2O9 Memory Capacitor on Si”; Integrated Ferroelectrics, 34 (1-4): 1505-1512, (2001).
X.W. Wang, H.M. Bu, B.L. Laube, C.Caragianis-Broadbridge and T.P. Ma, “Improving 4H-SiC/SiO2 Interface Properties by Depositing Ultra-thin Si Nitride Layer Prior to Formation of SiO2 and Annealing”, Trans Tech Publications; Material Science Forum, Vols. 389-393, 993 (2001).
A. Chen, A. Yulius, J. M. Woodall and C. Caragianis-Broadbridge, “Parasitic LPE/MBE of InP on GaP”, Applied. Phys. Letters., 85, 3447(2004).
J. Su, G. Cui, M. Gherasimova, H. Tsukamoto, J. Han, D. Ciuparu, S. Lim, L. Pfeferle, Y. He, A. V. Nurmikko, C. C. Broadbridge and A. Lehman, “Catalytic growth of AlGaInN Nanowires and Nanostructures by MOCVD”, Applied. Phys. Letters., 86 (2005)
S. Calvin, S.X. Luo, C.C. Broadbridge, J.K. McGuinness, E. Anderson,
A. Lehman, K.H. Wee,
J. Su, M. Gherasimova, G. Cui, H. Tsukamoto, J. Han, T. Onuma, M. Kurimoto, S. F. Chichibu, C. Broadbridge, Y. He, A. V. Nurmiko, “Growth of AlGaN Nanowires by Metalorganic Chemical Vapor Deposition”, Appl. Phys. Lett. 87, 183108 (2005).
R. Fitsimmons, R. Koekkoek, C. C. Broadbridge, A. Lehman and K. Cummings, “An exploration of microscopy for educational applications in the high school classroom”, in Journal of Materials Education, vol. 28(1): 99-104 (2006).
INVITED LECTURES AND CONTRIBUTED ORAL PRESENTATIONS:
"Application of High Pressure Techniques for the Synthesis of Metastable Thin Film Oxides from Alloys of Si1-xGex", ASM/TMS Materials Week, Rosemont, Illinois, International Conference on Synthesis and Processing of Advanced Materials; Invited lecture, Oct. 1994.
"A Cross-sectional AFM study of Nanocrystalline
Ge Precipitates in SiO2 formed from Metastable Ge1-xSixO2"; invited lecture presented at
"Fabrication and Characterization of Electronic and Optoelectronic Materials"; invited lecture presented at Loctite Corporation on August 11, 1998.
"Impact of Deposition Method on the Microstructural and Electrical Properties of Thin Film Silica Aerogels", C. Caragianis-Broadbridge, L. Carmona, M. Farag, M. Guillorn, F. Stellabotte, International Symposium on Vacuum, Thin Films, Surfaces/Interfaces and Processing; Baltimore, MD; November 4, 1998.
"Fabrication and Characterization of Thin Film Silica Aerogels", C. Caragianis-Broadbridge, Burleigh Instruments Annual Users Meeting; November 6, 1998.
"Microstructural and Electrical Properties of
Thin Film Silica Aerogels as a Function of Processing
Method"; invited lecture presented at University of
"Microstructural and Electrical Properties of
Thin Film Silica Aerogels as a Function of Processing
Method"; invited lecture presented at University of
"The United Technologies/Trinity College Engineering
Initiative (UTCEI): A Proven Model for the Partnership of the
Future", Workshop presentation at the Council on Undergraduate Research
(CUR) National Conference, June 24, 2000;
"An Overview: Advanced Methods of Materials Characterization", Invited lecture presented at Yale University, Departments of Electrical Engineering and Applied Physics, November 30, 2000.
C. Caragianis-Broadbridge, “Impact of Processing Conditions on the Microstructural and Physical Characteristics of Ferroelectric-Gate Memory Capacitors”; contributed talk presented at the Materials Research Society Fall Meeting; Boston, MA; November 2001.
J.-P. Han, C.J. Xie, K.-H. Kim, C.Caragianis-Broadbridge, D. L. Pechkis,
Y.X. Liu, W. Tong, A.H. Lehman, and T. P. Ma, Temperature
Dependence of Crystallinity, Strain, & Memory
Effect of SBT/SiN/Si Structure, contributed talk
presented by co-author at Ferroelectrics 2002,
B.
L. Laube, X. W. Wang, H. M. Bu, C. Caragianis-Broadbridge, T. P. Ma, “Angle Resolved X-ray
Photoelectron Spectroscopy (ARXPS) of SiO2/ultra-thin Si3N4/4H-SiC
for Improved Channel Mobility in MOSFETs”,
contributed talk presented by co-author at Surface Analysis 2002,
“Advanced
Methods of Materials Characterization with Applications to Dielectrics for
Integrated Circuits”; invited lecture presented at
“Studying Structure-Property Relationships at the Nanoscale: Methods and Challenges for the IC Industry”; invited lecture presented at UCONN Institute of Materials Science, Storrs, CT on March 24, 2004.
S.
X. Luo, S. Calvin, J. McGuinness, E. Anderson, C. Caragianis-Broadbridge, A. Lehman and L. K. Kurihara, “Comparison of Methods for Determining Mean Size
of Polydispersed Nanoparticles
(how small is small)”, Contributed talk by co-author presented at the Annual
APS March Meeting, March 26, 2004,
“Preparation, Microstructure and Physical Characteristics of Ferroelectric Thin Films for Memory Applications”, contributed talk presented at the CSU Faculty Research Conference, SCSU, April 24, 2004.
S. Walck, Z. Radi, A. Barna, J. Lehman, C.C. Broadbridge, C. Tirrell and M. Enjalran, invited presentation at The International Conference on Metallurgical Coatings and Thin Films San Diego, CA on April 23, 2007.
RECENT GRANTS RECEIVED:
National
Science Foundation “Materials Research
Science and
USDA,
National Science Foundation “Research
Philips
Semiconductor, Equipment Donation for Materials Characterization Laboratory,
SCSU,
NASA Experimental Program to Stimulate Competitive Research (EPSCoR); May 1999-00, May 2000-2001.
National Science Foundation; "Microstructural, Optical and Electrical Properties of Thin Film Silica Aerogels as a Function of Processing Method", May 98 – April 01, PI
National Science Foundation; "Acquisition of a Transmission Electron Microscope for Research and Research Training in the Liberal Arts College Environment", 2 years, co – PI
Supplemental Grant from NSF for Transmission Electron Microscope, co – PI
United Technologies Corporation/Trinity College Engineering Initiative (UTCEI); 6 year – 1995-2001, Director (June 1995 – August 2000).
Planning grant from United Technologies Corporation for the Hartford Regional High School Resource Center and UTCEI joint planning, 2-year, (June 1995 – August 2000).
Intel Corporation; Equipment Donation for
Loctite Corporation; Equipment Donation for
Materials Engineering Laboratory,
United Technologies Corporation; Equipment Donation of An Analytical Electron Microscope, November 1996.
W. M. Keck Foundation; Grant for Development of Keck
Optical Diagnostics and Communications Laboratory; 2 years, co- PI, December
1993.
GENERAL RESEARCH INTERESTS:
Condensed Matter Physics
Materials Science and Engineering
Advanced method of materials characterization including:
Atomic force microscopy
Scanning tunneling microscopy
Transmission electron microscopy
Scanning electron microscopy
Energy dispersive X-ray spectroscopy
X-ray diffraction
Auger spectroscopy
X-Ray photoelectron spectroscopy
Fabrication of dielectrics for microelectronic and optoelectronic applications
Processing and Characterization of Nanomaterials
Specimen
preparation for Transmission Electron Microscope and Atomic Force
Microscopy studies
CURRENT/FUTURE SPECIFIC RESEARCH PROJECTS:
“Center for Research on Interface Structures and Phenomena (CRISP): Yale/SCSU Collaborative Projects”
“Microstructural and Physical Characterization of Complex Oxide Interfaces”
“Studying Structure-Property Relationships at the Nanoscale:
Methods and Challenges for the IC Industry”
CURRENT STUDENT INVOLVEMENT/COLLABORATION IN MY RESEARCH:
CRISP Research Experience for Undergraduates Program (CRISP REU @ SCSU)
Example projects: Monica Sawicki, “Preparation of complex oxide interfaces for TEM evaluation”; Charles Tirrell and Patrick Carter “Computational modeling of the electric field line distribution surrounding focus ion beam thinned TEM specimens”
DISSERTATION TITLE:
"Oxidation of Silicon-Germanium Alloys at Atmospheric Pressure"
INSTITUTION GRANTING Ph.D.: